Centre for Shared Use of the Electron Microscope and Laser Sedimentograph of the Department of Earth Sciences of the National Academy of Sciences of Ukraine
Center for collective use of scientific equipment
Information about the equipment request
The name of the equipment
Benchtop X-ray fluorescence analyser (XRF) Hitachi X-Supreme 8000 (XSP-Minerals), Hitachi High-Tech Analitical Science, Germany
Identifier
req.ps2cnx
Status
received
Estimated cost
65.50
thousands of euros
Functional purpose of the equipment
Analysis of the composition of both solid and liquid samples (range of elements from Na to U), effectively expanding the Centre's functionality
Motivation of the need for equipment
Profound modernisation of the particle size distribution analysis system by purchasing a benchtop X-ray fluorescence analyser (XRF) for general elemental analysis. The device is compact and can be used in the field, has a low cost compared to similar devices, the range of elements from Na to U is extended compared to analogues