Center for the collective use of scientific equipment «Laboratory of materials science for solar energy, sensory and nanoelectronic systems»
Center for collective use of scientific equipment

Equipment information

The name of the equipment

Scanning Electron Microscopy FEI Inspect S50-B

Identifier

eqp.bk9teh

Status

Published

Date of manufacture

Dec. 6, 2018

Purchase date

Dec. 13, 2018

Country of manufacture

Not specified

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Functional purpose of the equipment

Measurement of linear dimensions, shape, orientation and other parameters of nanostructures and microrelief surfaces of various objects, including biological ones.

Owner institution

SUMSKYY DERZHAVNYY UNIVERSYTET

Center for the collective use of scientific equipment «Laboratory of materials science for solar energy, sensory and nanoelectronic systems» Center for collective use of scientific equipment

Equipment information

Center for the collective use of scientific equipment «Laboratory of materials science for solar energy, sensory and nanoelectronic systems»
Center for collective use of scientific equipment