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Equipment Sharing Center at the V. Lashkaryov Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine "Diagnostics of Semiconductor Materials, Structures and Devices".
Center for collective use of scientific equipment

A list of the available equipment of the CCUSE

Total: 10
Published
Equipment ID: eqp.c9yjy7
Scanning probe microscope NanoScope IIIa Dimension 3000™
Date of manufacture

Jan. 1, 1996

Purchase date

June 16, 1997

Country of manufacture

США

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.xh21pz
High-resolution X-ray diffractometer X'Pert PRO MRD
Date of manufacture

Jan. 1, 2005

Purchase date

Feb. 28, 2006

Country of manufacture

Netherlands

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.2heker
Horiba Jobin-Yvon T64000 Triple-Stage Confocal Spectrometer
Date of manufacture

Jan. 1, 2008

Purchase date

Sept. 16, 2009

Country of manufacture

Korea

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.zg5j5x
High-Precision Semiconductor Analyzer Agilent 4156C, High-Precision LCR Meter Agilent 4284A, and Optical Microscope Axioskop 2 MAT
Date of manufacture

Jan. 1, 2004

Purchase date

Jan. 1, 2005

Country of manufacture

США

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.q7zwjh
Infrared Vacuum Spectrometer Bruker Vertex 70V
Date of manufacture

Jan. 1, 2016

Purchase date

Jan. 26, 2017

Country of manufacture

Germany

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.c9ftp4
Semilab SE-2000 Spectroscopic Ellipsometer
Date of manufacture

Jan. 1, 2016

Purchase date

Jan. 26, 2017

Country of manufacture

Угорщина

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.2he3h9
Hall Effect Measurement System ezHEMS NanoMagnetics Instruments
Date of manufacture

Jan. 1, 2018

Purchase date

Not specified

Country of manufacture

England

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.zg5vbf
Secondary Ion Mass Spectrometer Atomika 4000 SIMS
Date of manufacture

Jan. 1, 1999

Purchase date

May 10, 2017

Country of manufacture

Germany

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.5q03dz
Integrated System ISP2000-124M with CAS14OCT-151M Spectrometer for measuring electrical, luminous, and color parameters of lighting systems
Date of manufacture

Jan. 1, 2012

Purchase date

April 5, 2013

Country of manufacture

Німечина

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device

Published
Equipment ID: eqp.bktejm
Setup for electrical and phototechnical testing of solar panels
Date of manufacture

Oct. 1, 2002

Purchase date

Oct. 1, 2002

Country of manufacture

Ukraine

Condition of scientific equipment/equipment

is used as intended (working), there are specialists who ensure the operation and servicing of the device