Equipment Sharing Center at the V. Lashkaryov Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine "Diagnostics of Semiconductor Materials, Structures and Devices".
Center for collective use of scientific equipment
Equipment information
The name of the equipment
Scanning probe microscope NanoScope IIIa Dimension 3000™
Identifier
eqp.c9yjy7
Status
Published
Date of manufacture
Jan. 1, 1996
Purchase date
June 16, 1997
Country of manufacture
США
Condition of scientific equipment/equipment
is used as intended (working), there are specialists who ensure the operation and servicing of the device
Functional purpose of the equipment
Investigation of the physical properties of surfaces at the micro- and nano scale:<br />
- Atomic force microscopy and spectroscopy;<br />
- Magnetic and electrostatic microscopy;<br />
- Kelvin probe force microscopy;<br />
- Conductive and capacitive microscopy (including mapping and local I-V and C-V characteristics);<br />
- Nanoindentation and mapping of surface elastic properties;<br />
- Nanotribology and wear resistance;<br />
- Techniques of nanolithography (mechanical and electrical) and nanomanipulation."
Owner institution
INSTYTUT FIZYKY NAPIVPROVIDNYKIV IMENI V.IE.LASHKAROVA NATSIONALNOYI AKADEMIYI NAUK UKRAYINY