Equipment Sharing Center at the V. Lashkaryov Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine "Diagnostics of Semiconductor Materials, Structures and Devices".
Center for collective use of scientific equipment
Equipment information
The name of the equipment
High-Precision Semiconductor Analyzer Agilent 4156C, High-Precision LCR Meter Agilent 4284A, and Optical Microscope Axioskop 2 MAT
Identifier
eqp.zg5j5x
Status
Published
Date of manufacture
Jan. 1, 2004
Purchase date
Jan. 1, 2005
Country of manufacture
США
Condition of scientific equipment/equipment
is used as intended (working), there are specialists who ensure the operation and servicing of the device
Functional purpose of the equipment
<br />
Measurement system for express testing of semiconductor materials and nanoscale devices:<br />
- Electrophysical studies of semiconductor structures in both DC and AC modes;<br />
- In DC mode: current-voltage characteristics (voltage range: 0.01 - 200 V, current range: 10 pA - 20 mA);<br />
- In AC mode (frequency range: 50 Hz - 1 MHz):<br />
- Capacitance-voltage characteristics;<br />
- Admittance spectroscopy (G, C vs. V, T);<br />
- Impedance spectroscopy (R, X vs. V, T);<br />
- Digital optical microscopy: bright and dark field, polarization contrast, luminescence, differential interference contrast (DIC)
Owner institution
INSTYTUT FIZYKY NAPIVPROVIDNYKIV IMENI V.IE.LASHKAROVA NATSIONALNOYI AKADEMIYI NAUK UKRAYINY