Equipment Sharing Center at the V. Lashkaryov Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine "Diagnostics of Semiconductor Materials, Structures and Devices".
Center for collective use of scientific equipment


The list of available orders for equipment of the CCUSE

Total: 1

received
Request ID: req.g8geyb
Estimated cost

407.66 thousands of euros

Functional purpose of the equipment

The primary scientific and technical purpose of the modern system is to research and optimize the functional electrophysical and photovoltaic parameters of materials, structures, and microelectronic components of semiconductor devices at the micro level. The microwave photoconductivity detection system (MDPmap) is a compact, benchtop, non-contact testing and research instrument for spatial micro-mapping of electrical parameters for offline process control and/or scientific research. The MDPmap is used for measuring carrier lifetime, photoconductivity, resistivity, and defect concentration as a function of the injected carrier density, both in steady-state and under short-pulse excitation up to 100 ns (μ-PCD). Integrating four different lasers into the MDPmap enables measurement of the carrier lifetime and photoconductivity over a very wide range of injected carrier densities.

Motivation of the need for equipment

Currently, Ukraine lacks a similar testing and diagnostic system for spatial micro-visualization and quantitative characterization of materials and electronic components of microelectronic devices. Moreover, the existing Soviet-era instruments for electrical measurements are morally and technically outdated and unsuitable for addressing technological and scientific challenges aimed at creating active elements of submicron-sized semiconductor microelectronics, particularly for the needs of the Armed Forces of Ukraine. Specifically, for the Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine, it is critically important for executing state and departmental projects related to the testing and diagnostic support of technological developments aimed at the practical production of infrared photodetector modules and 128x128 array elements based on narrow-band semiconductors for surveillance and targeting systems, as well as thermal imaging homing heads for high-precision weaponry (ATGMs, MANPADS, missiles of various classes).